Linear and Chiral Dichroism in the Electron Microscope View Front MatterView Back Matter

Linear and Chiral Dichroism in the Electron Microscope

by Peter Schattschneider

Peter Schattchneider has made many fundamental contributions to the theory of electron-beam imaging and spectroscopic techniques. In this book he reviews the promising new method of dichroism induced, not by light, but by the  electron beam of a modern transmission electron microscope, and detected using the energy-loss spectrum. The result is a spin-sensitive imaging method with far higher spatial resolution than similar synchrotron-based methods.

Prof. John Spence, Arizona State University, USA
  • Format: eBook
  • ISBN: 9789814303170
  • Subject: Microscopy
  • Published: February 2012
  • Pages: 262