Linear and Chiral Dichroism in the Electron Microscope

Peter Schattchneider has made many fundamental contributions to the theory of electron-beam imaging and spectroscopic techniques. In this book he reviews the promising new method of dichroism induced, not by light, but by the  electron beam of a modern transmission electron microscope, and detected using the energy-loss spectrum. The result is a spin-sensitive imaging method with far higher spatial resolution than similar synchrotron-based methods.

~Prof. John Spence, Arizona State University, USA

This state-of-the-art textbook describes how magnetic properties of solids can be investigated by using x-ray absorption and electron energy-loss spectroscopy. The main emphasis is on the underlying theory but experimental techniques, data analysis and recent results are also well covered. Chiral effects in anisotropic materials, multiplet and density-functional theory, magic-angle and relativistic effects, x-ray holography and the possibility of atomic-scale spin mapping are all described in detail by experts in these various fields.

~Prof. Ray Egerton, University of Alberta, Canada

This nice book provides a very useful approach of a recently developed technique, electron energy loss magnetic chiral dichroism (EMCD), available in transmission electron microscopy to detect if your sample presents anisotropic or magnetic effects (linear dichroism and chirality). The comparison with a previous X-Ray technique known as XMCD (X-ray magnetic circular dichroism), and this EMCD is clearly and usefully exposed. Advantages and disadvantages of both methods are discussed, spatial resolution also. With EMCD, atomic resolution can be hoped with new aberration corrected microscopes. Experimental situations in both cases are very understandably described and also the theory (necessity of the density matrix formulation, mixed dynamical form factor-MDFF) which is taken from the beginning. The figures are also very explicative. A very interesting book for students and searchers.

~Prof. Bernard Jouffrey, École Centrale Paris, France

This book covers the exciting new area of characterization of materials on the nanoscale by studying the chirality of electrons in transmission electron microscopy (TEM). Schattschneider, his team in Vienna and his colleagues all around the world, edited an extremely well written book which will have its impact for the important area of advanced characterisation techniques of materials with high spatial resolution- nearly on the atomic scale. The different techniques can be used by experienced microscopists who are able to understand the physics of the different inelastic scattering processes occurring in a specimen in TEM.

~Prof. Manfred Rühle, MPI for Intelligent Systems, Germany