David G. Seiler
David G. Seiler received his PhD and MS in physics from Purdue University and a BS in physics from Case Western Reserve University, Ohio. He is a fellow of the American
Physical Society and a fellow of the Institute of Electrical and Electronic Engineers. In 2000, he received a Distinguished Alumni Award from Purdue University’s School of Science for his contributions to and achievements in semiconductors. He
served as solid state physics program director in the Materials Research Division, National Science Foundation; spent a year’s sabbatical at the MIT Francis Bitter National Magnet
Laboratory; and was a regents’ professor of physics at the University of North Texas. He joined the National Institute of Standards and Technology (NIST) in 1988 and served as program analyst in the program office for the director of NIST and as materials technology group leader in the Engineering
Physics Division. Currently, he is chief of the division, which provides technical leadership in measurement science research, development, and standards essential to improving US economic competitiveness for advanced manufacturing. Dr. Seiler has been the chairperson and proceedings
editor of 15 international conferences or workshops. He is the coeditor and coauthor of a chapter in Semiconductors and Semimetals (1992, Vol. 36) and a coauthor of a chapter in Handbook of Optics (1995, revised 2009). His current research focus is on understanding and advancing the metrology and characterization measurements needed for the future of nanoelectronics. The results of his research have been disseminated in over 200 publications and 100 talks throughout the world.